Approach to building inspection tests of digital devices on extra large integrated circuits

Authors

  • Vasyl Kulikov Institute of Special Communications and Information Security National Technical University of Ukraine “Kiev Polytechnic Institute”,, Ukraine

DOI:

https://doi.org/10.20535/2411-1031.2012.1.1.53673

Abstract

Considered the problem of reducing the running in constructing a complete test for digital devices designed with using the VLSI circuits. The process of constructing a test for a given fault is reduced to finding the terminal vertices in the signals assignment tree. To reduce the iteration is proposed the focused search method wich designed to apply as the general theoretical method for finding solutions in productional type systems. Describes the results of experiments with the combinational circuits.

Author Biography

Vasyl Kulikov, Institute of Special Communications and Information Security National Technical University of Ukraine “Kiev Polytechnic Institute”,

Candidate of Technical Sciences, Associate Professor,
Associate Professor of department

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Published

2012-06-30

How to Cite

Kulikov, V. (2012). Approach to building inspection tests of digital devices on extra large integrated circuits. Collection "Information Technology and Security", 1(1), 83–92. https://doi.org/10.20535/2411-1031.2012.1.1.53673

Issue

Vol. 1 No. 1 (2012)

Section

ARTICLES

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