Comparative analysis of construction methods of tests for digital devices
DOI:
https://doi.org/10.20535/2411-1031.2012.1.2.54985Abstract
Considers the problem of low efficiency of the known deterministic methods for constructing tests for digital circuits. Showed that the main reason of their unsuitability for complex circuits is uncontrolled search of the all combinations of signals, that provide the display of fault on the output of faulty element, and the signals, that provide transporting of the distorted signal to one of circuits output. The result of the analysis is the conclusion about the preference of choice of the focused search method for tests construction.
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