KULIKOV, V. Comparative analysis of construction methods of tests for digital devices. Collection "Information Technology and Security", [S. l.], v. 1, n. 2, p. 34–44, 2012. DOI: 10.20535/2411-1031.2012.1.2.54985. Disponível em: https://its.iszzi.kpi.ua/article/view/54985. Acesso em: 19 apr. 2024.