KULIKOV, V. Approach to building inspection tests of digital devices on extra large integrated circuits. Information Technology and Security, [S. l.], v. 1, n. 1, p. 83–92, 2012. DOI: 10.20535/2411-1031.2012.1.1.53673. Disponível em: http://its.iszzi.kpi.ua/article/view/53673. Acesso em: 21 sep. 2021.