SAKOVYCH, L.; KHODYCH, O.; MARTUSENKO, Y.; BILAN, I. Assessment of the impact of metrological and diagnostic support on reliability of digital devices. Collection "Information Technology and Security", [S. l.], v. 10, n. 2, p. 194–203, 2022. DOI: 10.20535/2411-1031.2022.10.2.270426. Disponível em: https://its.iszzi.kpi.ua/article/view/270426. Acesso em: 25 apr. 2024.